{"id":87819,"date":"2003-04-15T12:00:00","date_gmt":"2003-04-15T10:00:00","guid":{"rendered":"https:\/\/industry-science.com\/artikel\/improving-production-lines-using-automated-semi-e10-analysis\/"},"modified":"2003-04-15T12:00:00","modified_gmt":"2003-04-15T12:00:00","slug":"improving-production-lines-using-automated-semi-e10-analysis","status":"publish","type":"article","link":"https:\/\/industry-science.com\/en\/articles\/improving-production-lines-using-automated-semi-e10-analysis\/","title":{"rendered":"Improving Production Lines using Automated SEMI E10 Analysis"},"content":{"rendered":"<div id=\"download-section\" class=\"gito-pub-download-section\" style=\"text-align:center;margin:20px;\">\n<h2>Your downloads<\/h2>\n<p><button style=\"font-size:14px;margin-right:15px;\" class=\"button gito-pub-cpt-download-button\" data-postid=\"87819\" data-userid =\"0\" data-filename=\"IM-2-2003dreyer.pdf\"><span style=\"margin-top:5px !important;\" class=\"dashicons dashicons-download\"><\/span>&nbsp;&nbsp;PDF<\/button><\/div>\n<br>Potentials: <span class=\"gito-pub-tag-element\"><a href=\"\/potentials\/profitability\/\">Profitability<\/a><\/span> <div class=\"gito-pub-tags-social-share\" style=\"display:flex;justify-content:space-between;\"><div>Tags: <span class=\"gito-pub-tag-element\"><a href=\"\/tag\/automatic-analysis\/\">automatic analysis<\/a><\/span> <span class=\"gito-pub-tag-element\"><a href=\"\/tag\/emiconductor-industry\/\">emiconductor industry<\/a><\/span> <span class=\"gito-pub-tag-element\"><a href=\"\/tag\/semi-standard\/\">SEMI-Standard<\/a><\/span> <\/div><div><div class=\"social-icons share-icons share-row relative\" ><a href=\"whatsapp:\/\/send?text=Improving%20Production%20Lines%20using%20Automated%20SEMI%20E10%20Analysis - https:\/\/industry-science.com\/en\/articles\/improving-production-lines-using-automated-semi-e10-analysis\/\" data-action=\"share\/whatsapp\/share\" class=\"icon button circle is-outline tooltip whatsapp show-for-medium\" title=\"Share on WhatsApp\" aria-label=\"Share on WhatsApp\"><i class=\"icon-whatsapp\" aria-hidden=\"true\"><\/i><\/a><a href=\"https:\/\/www.facebook.com\/sharer.php?u=https:\/\/industry-science.com\/en\/articles\/improving-production-lines-using-automated-semi-e10-analysis\/\" data-label=\"Facebook\" onclick=\"window.open(this.href,this.title,'width=500,height=500,top=300px,left=300px'); return false;\" target=\"_blank\" class=\"icon button circle is-outline tooltip facebook\" title=\"Share on Facebook\" aria-label=\"Share on Facebook\" rel=\"noopener nofollow\"><i class=\"icon-facebook\" aria-hidden=\"true\"><\/i><\/a><a href=\"https:\/\/x.com\/share?url=https:\/\/industry-science.com\/en\/articles\/improving-production-lines-using-automated-semi-e10-analysis\/\" onclick=\"window.open(this.href,this.title,'width=500,height=500,top=300px,left=300px'); return false;\" target=\"_blank\" class=\"icon button circle is-outline tooltip x\" title=\"Share on X\" aria-label=\"Share on X\" rel=\"noopener nofollow\"><i class=\"icon-x\" aria-hidden=\"true\"><\/i><\/a><a href=\"mailto:?subject=Improving%20Production%20Lines%20using%20Automated%20SEMI%20E10%20Analysis&body=Check%20this%20out%3A%20https%3A%2F%2Findustry-science.com%2Fen%2Farticles%2Fimproving-production-lines-using-automated-semi-e10-analysis%2F\" class=\"icon button circle is-outline tooltip email\" title=\"Email to a Friend\" aria-label=\"Email to a Friend\" rel=\"nofollow\"><i class=\"icon-envelop\" aria-hidden=\"true\"><\/i><\/a><a href=\"https:\/\/www.linkedin.com\/shareArticle?mini=true&url=https:\/\/industry-science.com\/en\/articles\/improving-production-lines-using-automated-semi-e10-analysis\/&title=Improving%20Production%20Lines%20using%20Automated%20SEMI%20E10%20Analysis\" onclick=\"window.open(this.href,this.title,'width=500,height=500,top=300px,left=300px'); return false;\" target=\"_blank\" class=\"icon button circle is-outline tooltip linkedin\" title=\"Share on LinkedIn\" aria-label=\"Share on LinkedIn\" rel=\"noopener nofollow\"><i class=\"icon-linkedin\" aria-hidden=\"true\"><\/i><\/a><\/div><\/div><\/div><hr style=\"margin-top:0px;\">\n","protected":false},"excerpt":{"rendered":"<p>Due to the high costs of procuring new equipment and building new plants in the semiconductor industry, the increase in the productivity of the existing equipment and facilities becomes even more critical.  Organizations today are looking to avoid any unnecessary investments into their equipment and facilities and maximizing the returns on their investments.  The SEMI organization has released standard methods of measuring the performance of processes and systems with the analysis of OEE (Overall Equipment Efficiency) and RAM (Reliability, Availability, Maintainability).  The introduction of Fab wide solutions, based on these methods, enables a continuous monitoring and improvement process of realizing potential savings and increasing the performance of these processes and sys-tems.  The company AIS Automation has developed such a software solution and sells it as TFM (Total Fab Monitoring).  This article describes the usage of the system where the application field is not limited only to the semiconductor in dustry.<\/p>\n","protected":false},"featured_media":99212,"menu_order":0,"template":"","categories":[],"tags":[68039,68040,68036],"product_cat":[],"topic":[],"technology":[],"knowhow":[],"industry":[],"writer":[80759],"content-type":[],"potential":[67658],"solution":[],"glossary":[],"class_list":{"0":"post-87819","1":"article","2":"type-article","3":"status-publish","4":"has-post-thumbnail","6":"tag-automatic-analysis","7":"tag-emiconductor-industry","8":"tag-semi-standard","9":"writer-thomas-dreyer-en","10":"potential-profitability","11":"product","12":"first","13":"instock","14":"downloadable","15":"virtual","16":"sold-individually","17":"taxable","18":"purchasable","19":"product-type-article"},"uagb_featured_image_src":{"full":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788.jpg",1400,788,false],"thumbnail":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-150x150.jpg",150,150,true],"medium":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-666x375.jpg",666,375,true],"medium_large":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-768x432.jpg",768,432,true],"large":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-1024x576.jpg",1020,574,true],"front-page-entry":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-1032x320.jpg",1032,320,true],"post-entry":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-764x376.jpg",764,376,true],"post-teaser":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-392x320.jpg",392,320,true],"post-teaser-mobile":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-608x496.jpg",608,496,true],"post-custom-size":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-640x325.jpg",640,325,true],"whitepaper-teaser":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-274x376.jpg",274,376,true],"card-big":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-514x292.jpg",514,292,true],"card-portrait":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-320x440.jpg",320,440,true],"card-big-company":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-514x289.jpg",514,289,true],"gp-listing":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-196x180.jpg",196,180,true],"1536x1536":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788.jpg",1400,788,false],"2048x2048":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788.jpg",1400,788,false],"woocommerce_thumbnail":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-510x510.jpg",510,510,true],"woocommerce_single":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-510x287.jpg",510,287,true],"woocommerce_gallery_thumbnail":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-100x100.jpg",100,100,true],"dgwt-wcas-product-suggestion":["https:\/\/industry-science.com\/wp-content\/uploads\/2024\/03\/IM-2-2003dreyer-1400x788-64x36.jpg",64,36,true]},"uagb_author_info":{"display_name":"Christoph Brocks","author_link":"https:\/\/industry-science.com\/en\/author\/"},"uagb_comment_info":0,"uagb_excerpt":"Due to the high costs of procuring new equipment and building new plants in the semiconductor industry, the increase in the productivity of the existing equipment and facilities becomes even more critical. Organizations today are looking to avoid any unnecessary investments into their equipment and facilities and maximizing the returns on their investments. The SEMI&hellip;","_links":{"self":[{"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/article\/87819","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/article"}],"about":[{"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/types\/article"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/media\/99212"}],"wp:attachment":[{"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/media?parent=87819"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/categories?post=87819"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/tags?post=87819"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/product_cat?post=87819"},{"taxonomy":"topic","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/topic?post=87819"},{"taxonomy":"technology","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/technology?post=87819"},{"taxonomy":"knowhow","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/knowhow?post=87819"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/industry?post=87819"},{"taxonomy":"writer","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/writer?post=87819"},{"taxonomy":"content-type","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/content-type?post=87819"},{"taxonomy":"potential","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/potential?post=87819"},{"taxonomy":"solution","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/solution?post=87819"},{"taxonomy":"glossary","embeddable":true,"href":"https:\/\/industry-science.com\/en\/wp-json\/wp\/v2\/glossary?post=87819"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}